@inproceedings{ González_Dappe_BIEL,

author = { César González and Yannick Dappe and BLANCA BIEL RUIZ } ,

title = { Defect Fingerprints and Reactivity by Ab Initio-Based STM and AFM Simulations in Single Layer MoS2 },

booktitle = { International Conference on Electronic Materials },

year = { 2016 },

pages = { None - None },

location = { Singapore, Singapore },

}